Temperature dependence of the locked mode in a single-electron latch. - Ravi K. Kummamuru; Mo Liu 005; Alexei O. Orlov; Craig S. Lent; Gary H. Bernstein; Gregory L. Snider (Microelectron. J., 2005)

Reliability and Defect Tolerance in Metallic Quantum-dot Cellular Automata. - Mo Liu 005; Craig S. Lent (J. Electron. Test., 2007)