Similar sample selection approach based on sequence alignment; application to semiconductor industry. - Mohamad Chakaroun; Mohand Djeziri; Mustapha Ouladsine; Jacques Pinaton (MED, 2014)

Defect diagnosis using in line product control data in semiconductor industry. - Mohamad Chakaroun; Mohand Djeziri; Mustapha Ouladsine; Jacques Pinaton (ICSC, 2015)