Derivation of the reliability metric for digital circuits. - Mohamed A. Abufalgha; Alex Bystrov (ETS, 2017)

Design-time reliability evaluation for digital circuits. - Mohamed A. Abufalgha; Alex Bystrov (IOLTS, 2017)

Bootstrapped Driver and the Single-Event-Upset Effect. - Mohammed Al-daloo; Mohamed A. Abufalgha; Alex Yakovlev; Basel Halak (IEEE Trans. Circuits Syst., 2020)