High performance electrical driven hotspot detection solution for full chip design using a novel device parameter matching technique. - Rami F. Salem; Mohamed Al-Imam; Abdelrahman ElMously; Haitham Eissa; Ahmed Arafa; Mohab H. Anis (ISQED, 2012)

Parameterized test patterns methodology for layout design rule checking verification. - Mohamed Tantawy; Rafik Guindi; Mohamed Dessouky; Mohamed Al-Imam (ICECS, 2015)