New short and efficient algorithm for testing random-access memories. - Mohamed Azimane; Antonio Lloris Ruiz (ICECS, 1998)

A special march test to detect delay coupling faults for RAMs. - Mohamed Azimane; Antonio Lloris Ruiz (ICECS, 2001)

New Test Methodology for Resistive Open Defect Detection in Memory Address Decoders. - Mohamed Azimane; Ananta K. Majhi (VTS, 2004)

Programmable techniques for cell stability test and debug in embedded SRAMs. - Andrei Pavlov; Manoj Sachdev; José Pineda de Gyvez; Mohamed Azimane (CICC, 2005)

Memory Testing Under Different Stress Conditions: An Industrial Evaluation. - Ananta K. Majhi; Mohamed Azimane; Guido Gronthoud; Maurice Lousberg; Stefan Eichenberger; Fred Bowen (DATE, 2005)

Memory testing improvements through different stress conditions. - Ananta K. Majhi; Mohamed Azimane; Guido Gronthoud; Maurice Lousberg; Stefan Eichenberger; Fred Bowen (ESSCIRC, 2005)

Word line pulsing technique for stability fault detection in SRAM cells. - Andrei Pavlov; Mohamed Azimane; José Pineda de Gyvez; Manoj Sachdev (ITC, 2005)

A New Algorithm for Dynamic Faults Detection in RAMs. - Mohamed Azimane; Ananta K. Majhi; Guido Gronthoud; Maurice Lousberg (VTS, 2005)

High-Quality Memory Test. - Mohamed Azimane (MTDT, 2006)

Test quality analysis and improvement for an embedded asynchronous FIFO. - Tobias Dubois; Erik Jan Marinissen; Mohamed Azimane; Paul Wielage; Erik Larsson; Clemens Wouters (DATE, 2007)

Reducing test cost for mixed signal circuits "From TOETS to ELESIS". - Mohamed Azimane (ETS, 2012)