Charging of radiation induced defects in RF MEMS dielectric films. - M. A. Exarchos; E. Papandreou; Patrick Pons; Mohamed Lamhamdi; George J. Papaioannou; Robert Plana (Microelectron. Reliab., 2006)

Charging-Effects in RF capacitive switches influence of insulating layers composition. - Mohamed Lamhamdi; Jean Guastavino; Laurent Boudou; Y. Segui; Patrick Pons; Laurent Bouscayrol; Robert Plana (Microelectron. Reliab., 2006)

Structure dependent charging process in RF MEMS capacitive switches. - E. Papandreou; Mohamed Lamhamdi; C. M. Skoulikidou; Patrick Pons; George J. Papaioannou; Robert Plana (Microelectron. Reliab., 2007)

Kelvin probe microscopy for reliability investigation of RF-MEMS capacitive switches. - A. Belarni; Mohamed Lamhamdi; Patrick Pons; Laurent Boudou; Jean Guastavino; Y. Segui; George J. Papaioannou; Robert Plana (Microelectron. Reliab., 2008)

Voltage and temperature effect on dielectric charging for RF-MEMS capacitive switches reliability investigation. - Mohamed Lamhamdi; Patrick Pons; Usama Zaghloul; Laurent Boudou; Fabio Coccetti; Jean Guastavino; Y. Segui; George J. Papaioannou; Robert Plana (Microelectron. Reliab., 2008)

Alpha particle radiation effects in RF MEMS capacitive switches. - Jinyu Jason Ruan; E. Papandreou; Mohamed Lamhamdi; Matroni Koutsoureli; Fabio Coccetti; Patrick Pons; George J. Papaioannou; Robert Plana (Microelectron. Reliab., 2008)

Développement d'outils d'analyse des matériaux pour l'étude du chargement des diélectriques: application à la fiabilité des micro-commutateurs RF à actionnement éléctrostatique. - Mohamed Lamhamdi (2008)

Remote Laboratory in Control Process during COVID-19 Pandemic Situation. - Hajar Baghdadi; Mohamed Massour el Aoud; Ismail Lagrat; Karim Rhofir; Noureddine Elbarbri; Mohamed Lamhamdi (Int. J. Online Biomed. Eng., 2021)