Traceable Reference Full Metrology Chain for Innovative Aspheric and Freeform Optical Surfaces Accurate at the Nanometer Level. - Yassir Arezki; Rong Su 002; Ville Heikkinen; François Leprete; Pavel Psota; Youichi Bitou; Christian Schober; Charyar-Mehdi Souzani; Bandar Abdulrahman Mohammed Alzahrani; Xiangchao Zhang; Yohan Kondo; Christof Pruss; et al. (Sensors, 2021)

Optimised calibration of machine vision system for close range photogrammetry based on machine learning. - Safouane El Ghazouali; Alain Vissiere; Louis-Ferdinand Lafon; Mohamed Lamjed Bouazizi; Hichem Nouira (J. King Saud Univ. Comput. Inf. Sci., 2022)