A stand-alone integrated excitation/extraction system for analog BIST applications. - Mohamed M. Hafed; Gordon W. Roberts (CICC, 2000)

A robust deep submicron programmable DC voltage generator. - Mohamed M. Hafed; Sébastien Laberge; Gordon W. Roberts (ISCAS, 2000)

A stand-alone integrated test core for time and frequency domain measurements. - Mohamed M. Hafed; Nazmy Abaskharoun; Gordon W. Roberts (ITC, 2000)

Strategies for on-chip sub-nanosecond signal capture and timing measurements. - Nazmy Abaskharoun; Mohamed M. Hafed; Gordon W. Roberts (ISCAS (4), 2001)

Test and Evaluation of Multiple Embedded Mixed-Signal Test Cores. - Mohamed M. Hafed; Gordon W. Roberts (ITC, 2002)

A 4-GHz effective sample rate integrated test core for analog and mixed-signal circuits. - Mohamed M. Hafed; Nazmy Abaskharoun; Gordon W. Roberts (IEEE J. Solid State Circuits, 2002)

A 5-channel, variable resolution, 10-GHz sampling rate coherent tester/oscilloscope IC and associated test vehicles. - Mohamed M. Hafed; Gordon W. Roberts (CICC, 2003)

An 8-channel, 12-bit, 20 MHz fully differential tester IC for analog and mixed-signal circuits. - Mohamed M. Hafed; Gordon W. Roberts (ESSCIRC, 2003)

Techniques for high-frequency integrated test and measurement. - Mohamed M. Hafed; Gordon W. Roberts (IEEE Trans. Instrum. Meas., 2003)

A High-Throughput 5 GBps Timing and Jitter Test Module Featuring Localized Processing. - Mohamed M. Hafed; Antonio H. Chan; Geoffrey D. Duerden; Bardia Pishdad; Clarence Tam; Sébastien Laberge; Gordon W. Roberts (ITC, 2004)