ANN-SVM-IP: An Innovative Method for Rapidly and Efficiently Detecting and Classifying of External Defects of Apple Fruits. - Nashaat M. Hussain Hassan; Mohamed M. Hassan Mahmoud; Mohamed A. Ismeil; M. Mourad Mabrook; Ahmed Abd El-Baset Donkol; A. Mosaad Mabrouk (IEEE Access, 2025)