Capacitive RF MEMS analytical predictive reliability and lifetime characterization. - Mohamed Matmat; Fabio Coccetti; Antoine Marty; Robert Plana; Christophe Escriba; Jean-Yves Fourniols; Daniel Estève (Microelectron. Reliab., 2009)

Life expectancy and characterization of capacitive RF MEMS switches. - Mohamed Matmat; K. Koukos; Fabio Coccetti; T. Idda; Antoine Marty; Christophe Escriba; Jean-Yves Fourniols; Daniel Estève (Microelectron. Reliab., 2010)