A New, Computationally Efficient "Blech Criterion" for Immortality in General Interconnects. - Mohammad Abdullah Al Shohel; Vidya A. Chhabria; Sachin S. Sapatnekar (DAC, 2021)

Analytical Modeling of Transient Electromigration Stress based on Boundary Reflections. - Mohammad Abdullah Al Shohel; Vidya A. Chhabria; Nestor E. Evmorfopoulos; Sachin S. Sapatnekar (ICCAD, 2021)

A Linear-Time Algorithm for Steady-State Analysis of Electromigration in General Interconnects. - Mohammad Abdullah Al Shohel; Vidya A. Chhabria; Sachin S. Sapatnekar (CoRR, 2021)

Frequency-Domain Transient Electromigration Analysis Using Circuit Theory. - Mohammad Abdullah Al Shohel; Vidya A. Chhabria; Nestoras E. Evmorfopoulos; Sachin S. Sapatnekar (ICCAD, 2023)

Recent Progress in the Analysis of Electromigration and Stress Migration in Large Multisegment Interconnects. - Nestor E. Evmorfopoulos; Mohammad Abdullah Al Shohel; Olympia Axelou; Pavlos Stoikos; Vidya A. Chhabria; Sachin S. Sapatnekar (ISPD, 2023)

An Analytical Solution for Transient Electromigration Stress in Multisegment Straight-line Interconnects Based on a Stress-wave Model. - Mohammad Abdullah Al Shohel; Vidya A. Chhabria; Nestoras E. Evmorfopoulos; Sachin S. Sapatnekar (ACM Trans. Design Autom. Electr. Syst., 2025)