Extreme-voltage stress vector generation of analog CMOS ICs for gate-oxide reliability enhancement. - Mohammad Athar Khalil; Chin-Long Wey (ITC, 2001)

High-Voltage Stress Test Paradigms of Analog CMOS ICs for Gate-Oxide Reliability Enhancement. - Mohammad Athar Khalil; Chin-Long Wey (VTS, 2001)

Hierarchical extreme-voltage stress test of analog CMOS ICs for gate-oxide reliability enhancement. - Chin-Long Wey; Mohammad Athar Khalil; Jim Liu; Gregory Wierzba (ACM Great Lakes Symposium on VLSI, 2004)