Predicting the Silent Data Error Prone Devices Using Machine Learning. - Mohammad Ershad Shaik; Abhishek Kumar Mishra; Yonghyun Kim (VTS, 2023)

WaferCap: Open Classification of Wafer Map Patterns using Deep Capsule Network. - Abhishek Kumar Mishra; Mohammad Ershad Shaik; Anush Niranjan Lingamoorthy; Suman Kumar; Anup Das 001; Nagarajan Kandasamy; Nur A. Touba (VTS, 2024)