Statistical modeling and simulation of variability and reliability of CMOS technology - Mohammad Khaled Hassan (2016)

Investigation of dependence between time-zero and time-dependent variability in high-κ NMOS transistors. - Mohammad Khaled Hassan; Kaushik Roy 001 (Microelectron. Reliab., 2017)

Adaptive accelerated aging for 28 nm HKMG technology. - Devyani Patra; Ahmed Kamal Reza; Mohammad Khaled Hassan; Mehdi Katoozi; Ethan H. Cannon; Kaushik Roy 001; Yu Cao 001 (Microelectron. Reliab., 2018)