Indicator of Alarm Risk on Product Degradation, Prediction for Alarms Grouping, Using Alarms Data in Semiconductor Manufacturing. - Mohammed Al-Kharaz; Bouchra Ananou; Mustapha Ouladsine; Michel Combal; Jacques Pinaton (CDC, 2019)

Evaluation of Alarm System Performance and Management in Semiconductor Manufacturing. - Mohammed Al-Kharaz; Bouchra Ananou; Mustapha Ouladsine; Michel Combal; Jacques Pinaton (CoDIT, 2019)

Quality Prediction in Semiconductor Manufacturing processes Using Multilayer Perceptron Feedforward Artificial Neural Network*. - Mohammed Al-Kharaz; Bouchra Ananou; Mustapha Ouladsine; Michel Combal; Jacques Pinaton (ICSC, 2019)

Cost-performance framework for the assessment of Modular Multilevel Converter in HVDC transmission applications. - Nathan Evans; Piotr Dworakowski; Mohammed Al-Kharaz; Sneha Hegde; Elie Perez; Florent Morel (IECON, 2019)

Data-Based Approach for Final Product Quality Inspection: Application to a Semiconductor Industry. - Mohammed Al-Kharaz; Bouchra Ananou; Mustapha Ouladsine; Michel Combal; Jacques Pinaton (CDC, 2021)

From Alarm System Events Towards Quality Inspection of The Final Product: Application to a Semiconductor Industry. - Mohammed Al-Kharaz; Bouchra Ananou; Mustapha Ouladsine; Michel Combal; Jacques Pinaton (ECC, 2021)

Combining Approaches of Brownian Motion and Similarity Principle to Improve the Remaining Useful Life Prediction. - Dima El Jamal; Mohammed Al-Kharaz; Bouchra Ananou; Guillaume Graton; Mustapha Ouladsine; Jacques Pinaton (ICPHM, 2021)

Forecasting Empty Container availability for Vehicle Booking System Application. - Arthur Cartel Foahom Gouabou; Mohammed Al-Kharaz; Faouzi Hakimi; Tarek Khaled; Kenza Amzil (KES, 2024)

Towards a Digital Twin Modeling Method for Container Terminal Port. - Faouzi Hakimi; Tarek Khaled; Mohammed Al-Kharaz; Arthur Cartel Foahom Gouabou; Kenza Amzil (KES, 2024)