IDVP (Intra-Die Variation Probe) for System-On-Chip (SoC) Infant Mortality screen. - Mohd Azman Abdul Latif; Noohul Basheer Zain Ali; Fawnizu Azmadi Hussin (ISCAS, 2011)

Design for cold test elimination - facing the Inverse Temperature Dependence (ITD) challenge. - Mohd Azman Abdul Latif; Noohul Basheer Zain Ali; Fawnizu Azmadi Hussin (ISCAS, 2012)

Implications of Burn-In Stress on NBTI Degradation. - Mohd Azman Abdul Latif; Noohul Basheer Zain Ali; Fawnizu Azmadi Hussin; Mark Zwolinski (CoRR, 2015)