Optimal and near-optimal algorithms for multiple fault diagnosis with unreliable tests. - Mojdeh Shakeri; Krishna R. Pattipati; Vijay Raghavan 005; Ann Patterson-Hine (IEEE Trans. Syst. Man Cybern. Part C, 1998)

Optimal and near-optimal test sequencing algorithms with realistic test models. - Vijay Raghavan 005; Mojdeh Shakeri; Krishna R. Pattipati (IEEE Trans. Syst. Man Cybern. Part A, 1999)

Test sequencing problems arising in test planning and design for testability. - Vijay Raghavan 005; Mojdeh Shakeri; Krishna R. Pattipati (IEEE Trans. Syst. Man Cybern. Part A, 1999)

Test sequencing algorithms with unreliable tests. - Vijay Raghavan 005; Mojdeh Shakeri; Krishna R. Pattipati (IEEE Trans. Syst. Man Cybern. Part A, 1999)

Sequential testing algorithms for multiple fault diagnosis. - Mojdeh Shakeri; Vijay Raghavan 005; Krishna R. Pattipati; Ann Patterson-Hine (IEEE Trans. Syst. Man Cybern. Part A, 2000)