A Block Partitioning Method for Region Exhaustive Test to Reduce the Number of Test Patterns and Improve Gate Exhaustive Fault Coverage. - Momona Mizota; Toshinori Hosokawa; Masayoshi Yoshimura; Masayuki Arai (DFT, 2023)

A Low Power Oriented Multiple Target Test Generation Method for 2-Cycle Gate-Exhaustive Faults. - Toshinori Hosokawa; Momona Mizota; Masayoshi Yoshimura; Masayuki Arai (DFT, 2024)