Effects of electromagnetic near-field stress on SiGe HBT's reliability. - Ali Alaeddine; Moncef Kadi; Kaouther Daoud; B. Mazari (Microelectron. Reliab., 2009)

Characteristics degradation of the SiGe HBT under electromagnetic field stress. - Ali Alaeddine; Moncef Kadi; Kaouther Daoud; B. Beydoun (Microelectron. Reliab., 2010)

Reliability study of AlGaN/GaN HEMT under electromagnetic, RF and DC stress. - Samh Khemiri; Moncef Kadi; Anne Louis (Microelectron. Reliab., 2011)

Experimental investigation of Zener diode reliability under pulsed Electrical Overstress (EOS). - Jian-Zhi Zhu; François Fouquet; Blaise Ravelo; Ali Alaeddine; Moncef Kadi (Microelectron. Reliab., 2013)

Study of the radiated emissions of an electric vehicle battery charger during the charge cycle. - Hanen Shall; Moncef Kadi (SSD, 2015)

High frequency characterization and modeling via measurements of power electronic capacitors under high bias voltage and temperature variations. - Fahim Hami; Habib Boulzazen; Moncef Kadi (I2MTC, 2015)

Conducted EMI evolution of power SiC MOSFET in a Buck converter after short-circuit aging tests. - Shawki Douzi; Moncef Kadi; Habib Boulzazen; Mohamed Tlig; Jaleleddine Ben Hadj Slama (Microelectron. Reliab., 2018)

Evolution of C-V and I-V characteristics for a commercial 600 V GaN GIT power device under repetitive short-circuit tests. - Jian-Zhi Fu; François Fouquet; Moncef Kadi; Pascal Dherbécourt (Microelectron. Reliab., 2018)

5G Ambient Backscatter Communications: Achievable Range and Power Levels in an Urban Environment. - Mariem Lefki; Sahbi Baccar; Hanen Shall; Mohamed Ghorbel; Moncef Kadi (RFID-TA, 2022)

A First Prototype of an Ambient Backscatter Communication Tag Working in 5G-NR Frequency: Experimental Test and Power Levels Measurements. - Mariem Lefki; Sahbi Baccar; Moncef Kadi; Hanen Shall; Mohamed Ghorbel (RFID-TA, 2024)

A Neural Network-Empowered Inverse FSS Design and Synthesis Approach for 5G Shielding Applications. - Hanen Shall; Hiba Hawess; Sahbi Baccar; Moncef Kadi (IEEE Access, 2024)

Development and Validation of a Low-Cost, Low-Power Patient Monitoring System Using AmBC Technique. - Moni Sankar Saha; Mariem Lefki; Sahbi Baccar; Moncef Kadi (SSD, 2025)

CAD Modeling of a Wafer-Level Packaging GaN Transistors for Electrothermal Simulation Using the Finite Element Method. - Mohamed Belguith; Sonia Eloued; Moncef Kadi; Jaleleddine Ben Hadj Slama; Mahmoud Hamouda (SMACD, 2025)