Coverage-Directed Test Generation Using Symbolic Techniques. - Daniel Geist; Monica Farkas; Avner Landver; Yossi Lichtenstein; Shmuel Ur; Yaron Wolfsthal (FMCAD, 1996)

A Methodology for the Verification of a "System on Chip". - Daniel Geist; Giora Biran; Tamarah Arons; Michael Slavkin; Yvgeny Nustov; Monica Farkas; Karen Holtz; Andy Long; Dave King; Steve Barret (DAC, 1999)