In-situ X-ray μLaue diffraction study of copper through-silicon vias. - Dario Ferreira Sanchez; Shay Reboh; Monica Larissa Djomeni Weleguela; Jean-Sébastien Micha; Odile Robach; Thierry Mourier; Patrice Gergaud; Pierre Bleuet (Microelectron. Reliab., 2016)