An Efficient Rule-Based OPC Approach Using a DRC Tool for 0.18mum ASIC. - Ji-Soong Park; Chul-Hong Park; Sang-Uhk Rhie; Yoo-Hyon Kim; Moon-Hyun Yoo; Jeong-Taek Kong; Hyung-Woo Kim; Sun-Il Yoo (ISQED, 2000)

A Hybrid PPC Method Based on the Empirical Etch Model for the 0.14µm DRAM Generation and Beyond. - Chul-Hong Park; Soo-Han Choi; Sang-Uhk Rhie; Dong-Hyun Kim; Jun-Seong Park; Tae-Hwang Jang; Ji-Soong Park; Yoo-Hyon Kim; Moon-Hyun Yoo; Jeong-Taek Kong (ISQED, 2002)

Elimination of false aggressors using the functional relationship for full-chip crosstalk analysis. - Jae-Seok Yang; Jeong-Yeol Kim; Joon-Ho Choi; Moon-Hyun Yoo; Jeong-Taek Kong (ISQED, 2003)

A Variable Reduction Technique for the Analysis of Ultra Large-Scale Power Distribution Networks. - Jong-Eun Koo; Kyung-Ho Lee; Young-Hoe Cheon; Joon-Ho Choi; Moon-Hyun Yoo; Jeong-Taek Kong (ISQED, 2004)

A Fast Lithography Verification Framework for Litho-Friendly Layout Design. - Yong-Chan Ban; Soo-Han Choi; Ki-Hung Lee; Dong-Hyun Kim; Jisuk Hong; Yoo-Hyon Kim; Moon-Hyun Yoo; Jeong-Taek Kong (ISQED, 2005)

Analysis for Complex Power Distribution Networks Considering Densely Populated Vias. - Young-Seok Hong; Heeseok Lee; Joon-Ho Choi; Moon-Hyun Yoo; Jeong-Taek Kong (ISQED, 2005)

SilcVerify: An Efficient Substrate Coupling Noise Simulation Tool for High-Speed & Nano-Scaled Memory Design. - Jeong-Yeol Kim; Ho-Soon Shin; Jong-Bae Lee; Moon-Hyun Yoo; Jeong-Taek Kong (ISQED, 2007)

The Statistical Failure Analysis for the Design of Robust SRAM in Nano-Scale Era. - Young-Gu Kim; Soo-Hwan Kim; Hoon Lim; Sanghoon Lee; Keun-Ho Lee; Young-Kwan Park; Moon-Hyun Yoo (ISQED, 2008)

Accurate Systematic Hot-Spot Scoring Method and Score-Based Fixing Guidance Generation. - Yonghee Park; Junghoe Choi; Jisuk Hong; Sanghoon Lee; Moon-Hyun Yoo; Jundong Cho (IEICE Trans. Fundam. Electron. Commun. Comput. Sci., 2009)

Suppression of Edge Effects Based on Analytic Model for Leakage Current Reduction of Sub-40 nm DRAM Device. - Soo-Han Choi; Young Hee Park; Chul-Hong Park; Sang Hoon Lee; Moon-Hyun Yoo; Jun Dong Cho; Gyu Tae Kim (IEICE Trans. Electron., 2010)