A built-in self test scheme for VLSI. - T. Raju Damarla; Wei Su; Gerald T. Michael; Moon J. Chung; Charles E. Stroud (ASP-DAC, 1995)

Faulty chip identification in a multi chip module system. - T. Raju Damarla; Moon J. Chung; Wei Su; Gerald T. Michael (VTS, 1996)