Design of a Grid Computing Infrastructure Based on Mainframes. - Moon J. Kim; Dikran S. Meliksetian (GCC, 2004)

Physical degradation of GaN HEMT devices under high drain bias reliability testing. - S. Y. Park; Carlo Floresca; Uttiya Chowdhury; Jose L. Jimenez; Cathy Lee; Edward Beam; Paul Saunier; Tony Balistreri; Moon J. Kim (Microelectron. Reliab., 2009)

Realization of the First GaN Based Tunnel Field-Effect Transistor. - Alexander Chaney; Henryk Turski; Kazuki Nomoto; Qingxiao Wang; Zongyang Hu; Moon J. Kim; Huili Grace Xing; Debdeep Jena (DRC, 2018)