The Characterization of Degradation on various SiON pMOSFET transistors under AC/DC NBTI stress. - Gang-Jun Kim; Moonjee Yoon; SungHwan Kim; Myeongkyu Eo; Shinhyung Kim; Taehun You; Namhyun Lee; Kijin Kim; Sangwoo Pae (IRPS, 2021)