Mapping from BPMN-Formed Business Processes to XPDL Business Processes. - Moonyoung Jung; Hak Soo Kim; Myung Hyun Jo; Kyung Hyun Tak; Hyun Suk Cha; Jin Hyun Son (ICEB, 2004)

Investigating Read-After-Write Delay in Ferroelectric FET with Gate-Side Injection. - Sizhe Ma; Saikat Chakraborty; Yixin Qin; Zijian Zhao 001; Jiahui Duan; Moonyoung Jung; Kijoon Kim; Suhwan Lim; Kwangyou Seo; Kwangsoo Kim; Wanki Kim; Daewon Ha; et al. (IRPS, 2025)

Retention Analysis of Ferroelectric FETs with Gate-Side Injection for Vertical NAND Storage. - Yixin Qin; Saikat Chakraborty; Zijian Zhao 001; Sizhe Ma; Moonyoung Jung; Kijoon Kim; Suhwan Lim; Kwangyou Seo; Kwangsoo Kim; Wanki Kim; Daewon Ha; Vijaykrishnan Narayanan; et al. (IRPS, 2025)

An In-Situ Spatial-Temporal Sequence Detector for Neuromorphic Vision Sensor Empowered by High Density Vertical NAND Storage. - Zijian Zhao 001; Varun Darshana Parekh; Po-Kai Hsu; Yixin Qin; Yiming Song; A. N. M. Nafiul Islam; Ningyuan Cao; Siddharth Joshi 001; Thomas Kämpfe; Moonyoung Jung; Kwangyou Seo; Kwangsoo Kim; et al. (CoRR, 2025)