Sparsity based sub-wavelength imaging with partially incoherent light via quadratic compressed sensing - Yoav Shechtman; Yonina C. Eldar; Alexander Szameit; Mordechai Segev (CoRR, 2011)

Designing and using prior data in Ankylography: Recovering a 3D object from a single diffraction intensity pattern - Eliyahu Osherovich; Oren Cohen; Yonina C. Eldar; Mordechai Segev (CoRR, 2012)

Sparsity based super-resolution in optical measurements. - Yoav Shechtman; Alexander Szameit; Eliyahu Osherovich; Pavel Sidorenko; Oren Cohen; Yonina C. Eldar; Mordechai Segev (CAMSAP, 2013)

Phase Retrieval with Application to Optical Imaging. - Yoav Shechtman; Yonina C. Eldar; Oren Cohen; Henry N. Chapman; Jianwei Miao; Mordechai Segev (CoRR, 2014)

Phase Retrieval with Application to Optical Imaging: A contemporary overview. - Yoav Shechtman; Yonina C. Eldar; Oren Cohen; Henry N. Chapman; Jianwei Miao; Mordechai Segev (IEEE Signal Process. Mag., 2015)

Topological optical waveguiding in SOI structures. - Imanol Andonegui; Andrea Blanco Redondo; Matthew J. Collins; G. Harari; Y. Lumer; M. C. Rechtsman; Benjamin J. Eggleton; Mordechai Segev; Angel J. García-Adeva (ICTON, 2016)

Sparsity based super-resolution optical imaging using correlation information. - Oren Solomon; Maor Mutzafi; Mordechai Segev; Yonina C. Eldar (ICASSP, 2017)

Sparsity-Based Super Resolution for SEM Images. - Shahar Tsiper; Or Dicker; Idan Kaizerman; Zeev Zohar; Mordechai Segev; Yonina C. Eldar (CoRR, 2017)

Deep Learning Reconstruction of Ultra-Short Pulses. - Tom Zahavy; Alex Dikopoltsev; Oren Cohen; Shie Mannor; Mordechai Segev (CoRR, 2018)

Topologically Protected Silicon Quantum Circuits. - Michelle Wang; Bryn Bell; Matthew J. Collins; D. Oren; Benjamin J. Eggleton; Mordechai Segev; Andrea Blanco Redondo (OFC, 2019)

Topologically robust entangled states in silicon. - Michelle Wang; Bryn Bell; Cooper Doyle; Matthew J. Collins; Benjamin J. Eggleton; Mordechai Segev; Andrea Blanco Redondo (OECC/PSC, 2019)

Deep learning reconstruction of ultrashort pulses from 2D spatial intensity patterns recorded by an all-in-line system in a single-shot. - Ron Ziv; Alex Dikopoltsev; Tom Zahavy; Ittai Rubinstein; Pavel Sidorenko; Oren Cohen; Mordechai Segev (CoRR, 2019)

SPARCOM: Sparsity Based Super-resolution Correlation Microscopy. - Oren Solomon; Yonina C. Eldar; Maor Mutzafi; Mordechai Segev (SIAM J. Imaging Sci., 2019)