Verification of the IBM RISC System/6000 by a Dynamic Biased Pseudo-Random Test Program Generator. - Aharon Aharon; Ayal Bar-David; Barry Dorfman; Emanuel Gofman; Moshe Leibowitz; Victor Schwartzburd (IBM Syst. J., 1991)

AC Test Quality: Beyond Transition Fault Coverage. - Yaron Aizenbud; Paul Chang; Moshe Leibowitz; Dave Smith; Bernd Könemann; Vijay S. Iyengar; Barry K. Rosen (ITC, 1992)