Reducing pessimism in RLC delay estimation using an accurate analytical frequency dependent model for inductance. - Mosin Mondal; Yehia Massoud (ICCAD, 2005)

Reliability Analysis for On-chip Networks under RC Interconnect Delay Variation. - Mosin Mondal; Xiang Wu; Adnan Aziz; Yehia Massoud (Nano-Net, 2006)

Accurate Loop Self Inductance Bound for Efficient Inductance Screening. - Mosin Mondal; Yehia Massoud (IEEE Trans. Very Large Scale Integr. Syst., 2006)

Predicting the Performance and Reliability of Carbon Nanotube Bundles for On-Chip Interconnect. - Arthur Nieuwoudt; Mosin Mondal; Yehia Massoud (ASP-DAC, 2007)

Thermally robust clocking schemes for 3D integrated circuits. - Mosin Mondal; Andrew J. Ricketts; Sami Kirolos; Tamer Ragheb; Greg M. Link; Narayanan Vijaykrishnan; Yehia Massoud (DATE, 2007)

Estimation of Capacitive Crosstalk-Induced Short-Circuit Energy. - Mosin Mondal; Sami Kirolos; Yehia Massoud (ISCAS, 2007)

Parameter-Variation-Aware Analysis for Noise Robustness. - Mosin Mondal; Kartik Mohanram; Yehia Massoud (ISQED, 2007)

Mitigating Thermal Effects on Clock Skew with Dynamically Adaptive Drivers. - Mosin Mondal; Andrew J. Ricketts; Sami Kirolos; Tamer Ragheb; Greg M. Link; Narayanan Vijaykrishnan; Yehia Massoud (ISQED, 2007)

Provisioning On-Chip Networks under Buffered RC Interconnect Delay Variations. - Mosin Mondal; Tamer Ragheb; Xiang Wu; Adnan Aziz; Yehia Massoud (ISQED, 2007)

A Methodology for the Estimation of Capacitive Crosstalk-Induced Short-Circuit Energy. - Mosin Mondal; Yehia Massoud (J. Circuits Syst. Comput., 2007)

Accurate Analytical Modeling of Frequency Dependent Loop Self-inductance. - Mosin Mondal; Yehia Massoud (J. Circuits Syst. Comput., 2008)

Design of Thermally Robust Clock Trees Using Dynamically Adaptive Clock Buffers. - Tamer Ragheb; Andrew J. Ricketts; Mosin Mondal; Sami Kirolos; Greg M. Link; Vijaykrishnan Narayanan; Yehia Massoud (IEEE Trans. Circuits Syst. I Regul. Pap., 2009)

Efficient hierarchical discretization of off-chip power delivery network geometries for 2.5D electrical analysis. - Mosin Mondal; James Pingenot; Vikram Jandhyala (ISQED, 2010)