A don't care identification method for test compaction. - Hiroshi Yamazaki; Motohiro Wakazono; Toshinori Hosokawa; Masayoshi Yoshimura (DDECS, 2013)

A Test Compaction Oriented Don't Care Identification Method Based on X-bit Distribution. - Hiroshi Yamazaki; Motohiro Wakazono; Toshinori Hosokawa; Masayoshi Yoshimura (IEICE Trans. Inf. Syst., 2013)