Negative and Positive Muon-Induced SEU Cross Sections in 28-nm and 65-nm Planar Bulk CMOS SRAMs. - Wang Liao; Masanori Hashimoto; Seiya Manabe; Yukinobu Watanabe; Shin-ichiro Abe; Keita Nakano; Hayato Takeshita; Motonobu Tampo; Soshi Takeshita; Yasuhiro Miyake (IRPS, 2019)