Test Cost Analysis for 3D Die-to-Wafer Stacking. - Mottaqiallah Taouil; Said Hamdioui; Kees Beenakker; Erik Jan Marinissen (Asian Test Symposium, 2010)

Performance and bandwidth optimization for biological sequence alignment. - Laiq Hasan; Zaid Al-Ars; Mottaqiallah Taouil; Koen Bertels (IDT, 2010)

On maximizing the compound yield for 3D Wafer-to-Wafer stacked ICs. - Mottaqiallah Taouil; Said Hamdioui; Jouke Verbree; Erik Jan Marinissen (ITC, 2010)

Yield Improvement and Test Cost Optimization for 3D Stacked ICs. - Said Hamdioui; Mottaqiallah Taouil (Asian Test Symposium, 2011)

Stacking order impact on overall 3D die-to-wafer Stacked-IC cost. - Mottaqiallah Taouil; Said Hamdioui (DDECS, 2011)

Layer Redundancy Based Yield Improvement for 3D Wafer-to-Wafer Stacked Memories. - Mottaqiallah Taouil; Said Hamdioui (ETS, 2011)

On modeling and optimizing cost in 3D Stacked-ICs. - Mottaqiallah Taouil; Said Hamdioui; Erik Jan Marinissen (IDT, 2011)

On optimizing test cost for Wafer-to-Wafer 3D-stacked ICs. - Mottaqiallah Taouil; Said Hamdioui (DTIS, 2012)

Yield Improvement for 3D Wafer-to-Wafer Stacked Memories. - Mottaqiallah Taouil; Said Hamdioui (J. Electron. Test., 2012)

Test Impact on the Overall Die-to-Wafer 3D Stacked IC Cost. - Mottaqiallah Taouil; Said Hamdioui; Kees Beenakker; Erik Jan Marinissen (J. Electron. Test., 2012)

Using 3D-COSTAR for 2.5D test cost optimization. - Mottaqiallah Taouil; Said Hamdioui; Erik Jan Marinissen; Sudipta Bhawmik (3DIC, 2013)

Is TSV-based 3D integration suitable for inter-die memory repair? - Mihai Lefter; George Razvan Voicu; Mottaqiallah Taouil; Marius Enachescu; Said Hamdioui; Sorin Dan Cotofana (DATE, 2013)

Impact of mid-bond testing in 3D stacked ICs. - Mottaqiallah Taouil; Said Hamdioui; Erik Jan Marinissen; Sudipta Bhawmik (DFTS, 2013)

Impact of partial resistive defects and Bias Temperature Instability on SRAM decoder reliablity. - Seyab Khan; Mottaqiallah Taouil; Said Hamdioui; Halil Kukner; Praveen Raghavan; Francky Catthoor (IDT, 2013)

Exploring test opportunities for memory and interconnects in 3D ICs. - Mottaqiallah Taouil; Mihai Lefter; Said Hamdioui (IDT, 2013)

Interconnect test for 3D stacked memory-on-logic. - Mottaqiallah Taouil; Mahmoud Masadeh; Said Hamdioui; Erik Jan Marinissen (DATE, 2014)

Direct probing on large-array fine-pitch micro-bumps of a wide-I/O logic-memory interface. - Erik Jan Marinissen; Bart De Wachter; Ken Smith; Jorg Kiesewetter; Mottaqiallah Taouil; Said Hamdioui (ITC, 2014)

Quality versus cost analysis for 3D Stacked ICs. - Mottaqiallah Taouil; Said Hamdioui; Erik Jan Marinissen (VTS, 2014)

Yield and Cost Analysis or 3D Stacked ICs. - Mottaqiallah Taouil (2014)

Memristor based computation-in-memory architecture for data-intensive applications. - Said Hamdioui; Lei Xie 005; Hoang Anh Du Nguyen; Mottaqiallah Taouil; Koen Bertels; Henk Corporaal; Hailong Jiao; Francky Catthoor; Dirk J. Wouters; Eike Linn; Jan van Lunteren (DATE, 2015)

Comparative analysis of RD and Atomistic trap-based BTI models on SRAM Sense Amplifier. - Innocent Agbo; Mottaqiallah Taouil; Said Hamdioui; Stefan Cosemans; Pieter Weckx; Praveen Raghavan; Francky Catthoor (DTIS, 2015)

On resistive open defect detection in DRAMs: The charge accumulation effect. - Yiorgos Sfikas; Yiorgos Tsiatouhas; Mottaqiallah Taouil; Said Hamdioui (ETS, 2015)

Fast boolean logic mapped on memristor crossbar. - Lei Xie 005; Hoang Anh Du Nguyen; Mottaqiallah Taouil; Koen Bertels; Said Hamdioui (ICCD, 2015)

BTI analysis of SRAM write driver. - Innocent Agbo; Mottaqiallah Taouil; Said Hamdioui; Pieter Weckx; Stefan Cosemans; Francky Catthoor (IDT, 2015)

Memory profiling for intra-application data-communication quantification: A survey. - Imran Ashraf; Mottaqiallah Taouil; Koen Bertels (IDT, 2015)

Computation-in-memory based parallel adder. - Hoang Anh Du Nguyen; Lei Xie 005; Mottaqiallah Taouil; Razvan Nane; Said Hamdioui; Koen Bertels (NANOARCH, 2015)

Interconnect networks for memristor crossbar. - Lei Xie 005; Hoang Anh Du Nguyen; Mottaqiallah Taouil; Said Hamdioui; Koen Bertels (NANOARCH, 2015)

Integral impact of BTI and voltage temperature variation on SRAM sense amplifier. - Innocent Agbo; Mottaqiallah Taouil; Said Hamdioui; Halil Kukner; Pieter Weckx; Praveen Raghavan; Francky Catthoor (VTS, 2015)

Testing Open Defects in Memristor-Based Memories. - Said Hamdioui; Mottaqiallah Taouil; Nor Zaidi Haron (IEEE Trans. Computers, 2015)

Post-Bond Interconnect Test and Diagnosis for 3-D Memory Stacked on Logic. - Mottaqiallah Taouil; Mahmoud Masadeh; Said Hamdioui; Erik Jan Marinissen (IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2015)

Yield Improvement for 3D Wafer-to-Wafer Stacked ICs Using Wafer Matching. - Mottaqiallah Taouil; Said Hamdioui; Erik Jan Marinissen (ACM Trans. Design Autom. Electr. Syst., 2015)

Comparative BTI analysis for various sense amplifier designs. - Innocent Agbo; Mottaqiallah Taouil; Said Hamdioui; Pieter Weckx; Stefan Cosemans; Praveen Raghavan; Francky Catthoor (DDECS, 2016)

Boolean logic gate exploration for memristor crossbar. - Lei Xie 005; Hoang Anh Du Nguyen; Mottaqiallah Taouil; Said Hamdioui; Koen Bertels (DTIS, 2016)

Read path degradation analysis in SRAM. - Innocent Agbo; Mottaqiallah Taouil; Said Hamdioui; Pieter Weckx; Stefan Cosemans; Francky Catthoor; Wim Dehaene (ETS, 2016)

Non-volatile look-up table based FPGA implementations. - Lei Xie 005; Hoang Anh Du Nguyen; Mottaqiallah Taouil; Said Hamdioui; Koen Bertels; Mohammad AlFailakawi (IDT, 2016)

Parallel matrix multiplication on memristor-based computation-in-memory architecture. - Adib Haron; Jintao Yu; Razvan Nane; Mottaqiallah Taouil; Said Hamdioui; Koen Bertels (HPCS, 2016)

Quantification of Sense Amplifier Offset Voltage Degradation due to Zero-and Run-Time Variability. - Innocent Agbo; Mottaqiallah Taouil; Said Hamdioui; Pieter Weckx; Stefan Cosemans; Praveen Raghavan; Francky Catthoor; Wim Dehaene (ISVLSI, 2016)

Synthesizing HDL to memristor technology: A generic framework. - Hoang Anh Du Nguyen; Lei Xie 005; Mottaqiallah Taouil; Said Hamdioui; Koen Bertels (NANOARCH, 2016)

Mitigation of sense amplifier degradation using input switching. - Daniel Kraak; Innocent Agbo; Mottaqiallah Taouil; Said Hamdioui; Pieter Weckx; Stefan Cosemans; Francky Catthoor; Wim Dehaene (DATE, 2017)

On the robustness of memristor based logic gates. - Lei Xie 005; Hoang Anh Du Nguyen; Jintao Yu; Mottaqiallah Taouil; Said Hamdioui (DDECS, 2017)

Interconnect networks for resistive computing architectures. - Hoang Anh Du Nguyen; Lei Xie 005; Jintao Yu; Mottaqiallah Taouil; Said Hamdioui (DTIS, 2017)

Scouting Logic: A Novel Memristor-Based Logic Design for Resistive Computing. - Lei Xie 005; Hoang Anh Du Nguyen; Jintao Yu; Ali Kaichouhi; Mottaqiallah Taouil; Mohammad AlFailakawi; Said Hamdioui (ISVLSI, 2017)

Memristive devices for computing: Beyond CMOS and beyond von Neumann. - Hoang Anh Du Nguyen; Jintao Yu; Lei Xie 005; Mottaqiallah Taouil; Said Hamdioui; Dietmar Fey (VLSI-SoC, 2017)

Integral Impact of BTI, PVT Variation, and Workload on SRAM Sense Amplifier. - Innocent Agbo; Mottaqiallah Taouil; Daniel Kraak; Said Hamdioui; Halil Kukner; Pieter Weckx; Praveen Raghavan; Francky Catthoor (IEEE Trans. Very Large Scale Integr. Syst., 2017)

Impact and Mitigation of Sense Amplifier Aging Degradation Using Realistic Workloads. - Daniel Kraak; Mottaqiallah Taouil; Innocent Agbo; Said Hamdioui; Pieter Weckx; Stefan Cosemans; Francky Catthoor (IEEE Trans. Very Large Scale Integr. Syst., 2017)

On the Implementation of Computation-in-Memory Parallel Adder. - Hoang Anh Du Nguyen; Lei Xie 005; Mottaqiallah Taouil; Razvan Nane; Said Hamdioui; Koen Bertels (IEEE Trans. Very Large Scale Integr. Syst., 2017)

Degradation analysis of high performance 14nm FinFET SRAM. - Daniel Kraak; Innocent Agbo; Mottaqiallah Taouil; Said Hamdioui; Pieter Weckx; Stefan Cosemans; Francky Catthoor (DATE, 2018)

Memristive devices for computation-in-memory. - Jintao Yu; Hoang Anh Du Nguyen; Lei Xie 005; Mottaqiallah Taouil; Said Hamdioui (DATE, 2018)

Device aging: A reliability and security concern. - Daniel Kraak; Mottaqiallah Taouil; Said Hamdioui; Pieter Weckx; Francky Catthoor; Abhijit Chatterjee; Adit D. Singh; Hans-Joachim Wunderlich; Naghmeh Karimi (ETS, 2018)

Testing Resistive Memories: Where are We and What is Missing? - Moritz Fieback; Mottaqiallah Taouil; Said Hamdioui (ITC, 2018)

Electrical Modeling of STT-MRAM Defects. - Lizhou Wu; Mottaqiallah Taouil; Siddharth Rao; Erik Jan Marinissen; Said Hamdioui (ITC, 2018)

Ionizing radiation modeling in DRAM transistors. - Moritz Fieback; Mottaqiallah Taouil; Said Hamdioui; Marco Rovatti (LATS, 2018)

Impact and mitigation of SRAM read path aging. - Innocent Agbo; Mottaqiallah Taouil; Daniel Kraak; Said Hamdioui; Pieter Weckx; Stefan Cosemans; Francky Catthoor; Wim Dehaene (Microelectron. Reliab., 2018)

A defect-oriented test approach using on-Chip current sensors for resistive defects in FinFET SRAMs. - G. Cardoso Medeiros; Letícia Maria Veiras Bolzani; Mottaqiallah Taouil; Fabian Vargas 001; Said Hamdioui (Microelectron. Reliab., 2018)

Memory and Communication Profiling for Accelerator-Based Platforms. - Imran Ashraf; Nader Khammassi; Mottaqiallah Taouil; Koen Bertels (IEEE Trans. Computers, 2018)

A Mapping Methodology of Boolean Logic Circuits on Memristor Crossbar. - Lei Xie 005; Hoang Anh Du Nguyen; Mottaqiallah Taouil; Said Hamdioui; Koen Bertels (IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2018)

Applications of Computation-In-Memory Architectures based on Memristive Devices. - Said Hamdioui; Hoang Anh Du Nguyen; Mottaqiallah Taouil; Abu Sebastian; Manuel Le Gallo; Sandeep Pande; Siebren Schaafsma; Francky Catthoor; Shidhartha Das; Fernando García-Redondo; Geethan Karunaratne; Abbas Rahimi; et al. (DATE, 2019)

Methodology for Application-Dependent Degradation Analysis of Memory Timing. - Daniel Kraak; Innocent Agbo; Mottaqiallah Taouil; Said Hamdioui; Pieter Weckx; Stefan Cosemans; Francky Catthoor (DATE, 2019)

Time-division Multiplexing Automata Processor. - Jintao Yu; Hoang Anh Du Nguyen; Muath Abu Lebdeh; Mottaqiallah Taouil; Said Hamdioui (DATE, 2019)

Hardware-Based Aging Mitigation Scheme for Memory Address Decoder. - Daniel Kraak; Innocent Agbo; Mottaqiallah Taouil; Said Hamdioui; Pieter Weckx; Stefan Cosemans; Francky Catthoor (ETS, 2019)

DFT Scheme for Hard-to-Detect Faults in FinFET SRAMs. - Guilherme Cardoso Medeiros; Mottaqiallah Taouil; Moritz Fieback; Leticia Bolzani Poehls; Said Hamdioui (ETS, 2019)

Pinhole Defect Characterization and Fault Modeling for STT-MRAM Testing. - Lizhou Wu; Siddharth Rao; Guilherme Cardoso Medeiros; Mottaqiallah Taouil; Erik Jan Marinissen; Farrukh Yasin; Sebastien Couet; Said Hamdioui; Gouri Sankar Kar (ETS, 2019)

Reliability Modeling and Mitigation for Embedded Memories. - Innocent Okwudili Agbo; Mottaqiallah Taouil; Said Hamdioui (ITC, 2019)

Device-Aware Test: A New Test Approach Towards DPPB Level. - Moritz Fieback; Lizhou Wu; Guilherme Cardoso Medeiros; Hassen Aziza; Siddharth Rao; Erik Jan Marinissen; Mottaqiallah Taouil; Said Hamdioui (ITC, 2019)

Testing Computation-in-Memory Architectures Based on Emerging Memories. - Said Hamdioui; Moritz Fieback; Surya Nagarajan; Mottaqiallah Taouil (ITC, 2019)

Software-Based Mitigation for Memory Address Decoder Aging. - Daniel H. P. Kraak; Cemil Cem Gürsoy; Innocent O. Agbo; Mottaqiallah Taouil; Maksim Jenihhin; Jaan Raik; Said Hamdioui (LATS, 2019)

A computation-in-memory accelerator based on resistive devices. - Hoang Anh Du Nguyen; Jintao Yu; Muath Abu Lebdeh; Mottaqiallah Taouil; Said Hamdioui (MEMSYS, 2019)

Enhanced Scouting Logic: A Robust Memristive Logic Design Scheme. - Jintao Yu; Hoang Anh Du Nguyen; Muath Abu Lebdeh; Mottaqiallah Taouil; Said Hamdioui (NANOARCH, 2019)

Energy Optimization for Large-Scale 3D Manycores in the Dark-Silicon Era. - Sohaib Majzoub; Resve A. Saleh; Imran Ashraf; Mottaqiallah Taouil; Said Hamdioui (IEEE Access, 2019)

System-Level Sub-20 nm Planar and FinFET CMOS Delay Modelling for Supply and Threshold Voltage Scaling Under Process Variation. - Sohaib Majzoub; Mottaqiallah Taouil; Said Hamdioui (J. Low Power Electron., 2019)

Challenges and Solutions in Emerging Memory Testing. - Elena-Ioana Vatajelu; Paolo Prinetto; Mottaqiallah Taouil; Said Hamdioui (IEEE Trans. Emerg. Top. Comput., 2019)

Parametric and Functional Degradation Analysis of Complete 14-nm FinFET SRAM. - Daniel Kraak; Mottaqiallah Taouil; Innocent Agbo; Said Hamdioui; Pieter Weckx; Stefan Cosemans; Francky Catthoor (IEEE Trans. Very Large Scale Integr. Syst., 2019)

The Power of Computation-in-Memory Based on Memristive Devices. - Jintao Yu; Muath Abu Lebdeh; Hoang Anh Du Nguyen; Mottaqiallah Taouil; Said Hamdioui (ASP-DAC, 2020)

RESCUE: Interdependent Challenges of Reliability, Security and Quality in Nanoelectronic Systems. - Maksim Jenihhin; Said Hamdioui; Matteo Sonza Reorda; Milos Krstic; Peter Langendörfer; Christian Sauer 001; Anton Klotz; Michael Hübner 001; Jörg Nolte; Heinrich Theodor Vierhaus; Georgios N. Selimis; Dan Alexandrescu; et al. (DATE, 2020)

Mitigation of Sense Amplifier Degradation Using Skewed Design. - Daniel Kraak; Mottaqiallah Taouil; Said Hamdioui; Pieter Weckx; Stefan Cosemans; Francky Catthoor (DATE, 2020)

A DFT Scheme to Improve Coverage of Hard-to-Detect Faults in FinFET SRAMs. - Guilherme Cardoso Medeiros; Cemil Cem Gürsoy; Lizhou Wu; Moritz Fieback; Maksim Jenihhin; Mottaqiallah Taouil; Said Hamdioui (DATE, 2020)

Impact of Magnetic Coupling and Density on STT-MRAM Performance. - Lizhou Wu; Siddharth Rao; Mottaqiallah Taouil; Erik Jan Marinissen; Gouri Sankar Kar; Said Hamdioui (DATE, 2020)

A Security Verification Template to Assess Cache Architecture Vulnerabilities. - Tara Ghasempouri; Jaan Raik; Kolin Paul; Cezar Reinbrecht; Said Hamdioui; Mottaqiallah Taouil (DDECS, 2020)

eSRAM Reliability: Why is it still not optimally solved? - Daniël Kraak; Mottaqiallah Taouil; Said Hamdioui; Pieter Weckx; Stefan Cosemans; Francky Catthoor (DTIS, 2020)

Testing Scouting Logic-Based Computation-in-Memory Architectures. - Moritz Fieback; Surya Nagarajan; Rajendra Bishnoi; Mehdi B. Tahoori; Mottaqiallah Taouil; Said Hamdioui (ETS, 2020)

G-PUF: An Intrinsic PUF Based on GPU Error Signatures. - Bruno Endres Forlin; Ronaldo Husemann; Luigi Carro; Cezar Reinbrecht; Said Hamdioui; Mottaqiallah Taouil (ETS, 2020)

Modeling Static Noise Margin for FinFET based SRAM PUFs. - Shayesteh Masoumian; Georgios N. Selimis; Roel Maes; Geert Jan Schrijen; Said Hamdioui; Mottaqiallah Taouil (ETS, 2020)

LiD-CAT: A Lightweight Detector for Cache ATtacks. - Cezar Reinbrecht; Said Hamdioui; Mottaqiallah Taouil; Behrad Niazmand; Tara Ghasempouri; Jaan Raik; Johanna Sepúlveda (ETS, 2020)

Device-Aware Test for Emerging Memories: Enabling Your Test Program for DPPB Level. - Lizhou Wu; Moritz Fieback; Mottaqiallah Taouil; Said Hamdioui (ETS, 2020)

RNN-Based Detection of Fault Attacks on RSA. - Troya Çagil Köylü; Cezar Rodolfo Wedig Reinbrecht; Said Hamdioui; Mottaqiallah Taouil (ISCAS, 2020)

Guard-NoC: A Protection Against Side-Channel Attacks for MPSoCs. - Cezar Reinbrecht; Abdullah Aljuffri; Said Hamdioui; Mottaqiallah Taouil; Bruno Endres Forlin; Johanna Sepúlveda (ISVLSI, 2020)

Characterization, Modeling and Test of Synthetic Anti-Ferromagnet Flip Defect in STT-MRAMs. - Lizhou Wu; Siddharth Rao; Mottaqiallah Taouil; Erik Jan Marinissen; Gouri Sankar Kar; Said Hamdioui (ITC, 2020)

Evaluating the Impact of Ionizing Particles on FinFET -based SRAMs with Weak Resistive Defects. - Thiago Copetti; Guilherme Cardoso Medeiros; Mottaqiallah Taouil; Said Hamdioui; Leticia Bolzani Poehls; Tiago R. Balen (LATS, 2020)

S-NET: A Confusion Based Countermeasure Against Power Attacks for SBOX. - Abdullah Aljuffri; Pradeep Venkatachalam; Cezar Reinbrecht; Said Hamdioui; Mottaqiallah Taouil (SAMOS, 2020)

An Energy-Efficient Current-Controlled Write and Read Scheme for Resistive RAMs (RRAMs). - Hassen Aziza; Mathieu Moreau; Moritz Fieback; Mottaqiallah Taouil; Said Hamdioui (IEEE Access, 2020)

Survey on STT-MRAM Testing: Failure Mechanisms, Fault Models, and Tests. - Lizhou Wu; Mottaqiallah Taouil; Siddharth Rao; Erik Jan Marinissen; Said Hamdioui (CoRR, 2020)

Public-Key Based Authentication Architecture for IoT Devices Using PUF. - Haji Akhundov; Erik van der Sluis; Said Hamdioui; Mottaqiallah Taouil (CoRR, 2020)

A Classification of Memory-Centric Computing. - Hoang Anh Du Nguyen; Jintao Yu; Muath Abu Lebdeh; Mottaqiallah Taouil; Said Hamdioui; Francky Catthoor (ACM J. Emerg. Technol. Comput. Syst., 2020)

Skeleton-Based Synthesis Flow for Computation-in-Memory Architectures. - Jintao Yu; Razvan Nane; Imran Ashraf; Mottaqiallah Taouil; Said Hamdioui; Henk Corporaal; Koen Bertels (IEEE Trans. Emerg. Top. Comput., 2020)

Density Enhancement of RRAMs using a RESET Write Termination for MLC Operation. - Hassen Aziza; Said Hamdioui; Moritz Fieback; Mottaqiallah Taouil; Mathieu Moreau (DATE, 2021)

GRINCH: A Cache Attack against GIFT Lightweight Cipher. - Cezar Reinbrecht; Abdullah Aljuffri; Said Hamdioui; Mottaqiallah Taouil; Johanna Sepúlveda (DATE, 2021)

Characterization and Fault Modeling of Intermediate State Defects in STT-MRAM. - Lizhou Wu; Siddharth Rao; Mottaqiallah Taouil; Erik Jan Marinissen; Gouri Sankar Kar; Said Hamdioui (DATE, 2021)

Revealing the Secrets of Spiking Neural Networks: The Case of Izhikevich Neuron. - Luíza C. Garaffa; Abdullah Aljuffri; Cezar Reinbrecht; Said Hamdioui; Mottaqiallah Taouil; Johanna Sepúlveda (DSD, 2021)

Protecting IoT Devices through a Hardware-driven Memory Verification. - Troya Çagil Köylü; Hans Okkerman; Cezar Rodolfo Wedig Reinbrecht; Said Hamdioui; Mottaqiallah Taouil (DSD, 2021)

Impact of Data Pre-Processing Techniques on Deep Learning Based Power Attacks. - Abdullah Aljuffri; Cezar Reinbrecht; Said Hamdioui; Mottaqiallah Taouil (DTIS, 2021)

Improving the Detection of Undefined State Faults in FinFET SRAMs. - G. Cardoso Medeiros; Moritz Fieback; Thiago Santos Copetti; Anteneh Gebregiorgis; Mottaqiallah Taouil; Leticia B. Poehls; Said Hamdioui (DTIS, 2021)

Power Side Channel Attacks: Where Are We Standing? - Mottaqiallah Taouil; Abdullah Aljuffri; Said Hamdioui (DTIS, 2021)

Intermittent Undefined State Fault in RRAMs. - Moritz Fieback; Guilherme Cardoso Medeiros; Anteneh Gebregiorgis; Hassen Aziza; Mottaqiallah Taouil; Said Hamdioui (ETS, 2021)

Detecting Random Read Faults to Reduce Test Escapes in FinFET SRAMs. - G. Cardoso Medeiros; Moritz Fieback; Anteneh Gebregiorgis; Mottaqiallah Taouil; Leticia Bolzani Poehls; Said Hamdioui (ETS, 2021)

LightRoAD: Lightweight Rowhammer Attack Detector. - Mottaqiallah Taouil; Cezar Reinbrecht; Said Hamdioui; Johanna Sepúlveda (ISVLSI, 2021)

Testing STT-MRAM: Manufacturing Defects, Fault Models, and Test Solutions. - Lizhou Wu; Siddharth Rao; Mottaqiallah Taouil; Erik Jan Marinissen; Gouri Sankar Kar; Said Hamdioui (ITC, 2021)

Deterministic and Statistical Strategies to Protect ANNs against Fault Injection Attacks. - Troya Çagil Köylü; Cezar Rodolfo Wedig Reinbrecht; Said Hamdioui; Mottaqiallah Taouil (PST, 2021)

Multi-Bit Blinding: A Countermeasure for RSA Against Side Channel Attacks. - Abdullah Aljuffri; Cezar Reinbrecht; Said Hamdioui; Mottaqiallah Taouil (VTS, 2021)

Evaluation of Single Event Upset Susceptibility of FinFET-based SRAMs with Weak Resistive Defects. - Thiago Copetti; Guilherme Cardoso Medeiros; Mottaqiallah Taouil; Said Hamdioui; Letícia Maria Bolzani Poehls; Tiago Roberto Balen (J. Electron. Test., 2021)

Defect and Fault Modeling Framework for STT-MRAM Testing. - Lizhou Wu; Siddharth Rao; Mottaqiallah Taouil; Guilherme Cardoso Medeiros; Moritz Fieback; Erik Jan Marinissen; Gouri Sankar Kar; Said Hamdioui (IEEE Trans. Emerg. Top. Comput., 2021)

Applying Thermal Side-Channel Attacks on Asymmetric Cryptography. - Abdullah Aljuffri; Marc Zwalua; Cezar Rodolfo Wedig Reinbrecht; Said Hamdioui; Mottaqiallah Taouil (IEEE Trans. Very Large Scale Integr. Syst., 2021)

Hard-to-Detect Fault Analysis in FinFET SRAMs. - Guilherme Cardoso Medeiros; Moritz Fieback; Lizhou Wu; Mottaqiallah Taouil; Letícia Maria Bolzani Poehls; Said Hamdioui (IEEE Trans. Very Large Scale Integr. Syst., 2021)

Using Hopfield Networks to Correct Instruction Faults. - Troya Çagil Köylü; Moritz Fieback; Said Hamdioui; Mottaqiallah Taouil (ATS, 2022)

Reliability Analysis of FinFET-Based SRAM PUFs for 16nm, 14nm, and 7nm Technology Nodes. - Shayesteh Masoumian; Georgios N. Selimis; Rui Wang; Geert Jan Schrijen; Said Hamdioui; Mottaqiallah Taouil (DATE, 2022)

Exploiting PUF Variation to Detect Fault Injection Attacks. - Troya Çagil Köylü; Luíza C. Garaffa; Cezar Reinbrecht; Mahdi Zahedi; Said Hamdioui; Mottaqiallah Taouil (DDECS, 2022)

PVT Analysis for RRAM and STT-MRAM-based Logic Computation-in-Memory. - Moritz Fieback; Christopher Münch; Anteneh Gebregiorgis; Guilherme Cardoso Medeiros; Mottaqiallah Taouil; Said Hamdioui; Mehdi B. Tahoori (ETS, 2022)

Smart Redundancy Schemes for ANNs Against Fault Attacks. - Troya Çagil Köylü; Said Hamdioui; Mottaqiallah Taouil (ETS, 2022)

Hierarchical Memory Diagnosis. - Guilherme Cardoso Medeiros; Moritz Fieback; Anteneh Gebregiorgis; Mottaqiallah Taouil; Letícia Maria Veiras Bolzani; Said Hamdioui (ETS, 2022)

Structured Test Development Approach for Computation-in-Memory Architectures. - Moritz Fieback; Mottaqiallah Taouil; Said Hamdioui (ITC-Asia, 2022)

On BTI Aging Rejuvenation in Memory Address Decoders. - Cemil Cem Gürsoy; Daniel Kraak; Foisal Ahmed; Mottaqiallah Taouil; Maksim Jenihhin; Said Hamdioui (LATS, 2022)

Rapid Design-Space Exploration for Low-Power Manycores Under Process Variation Utilizing Machine Learning. - Sohaib Majzoub; Resve A. Saleh; Mottaqiallah Taouil; Said Hamdioui; Mohamed Bamakhrama (IEEE Access, 2022)

Defects, Fault Modeling, and Test Development Framework for RRAMs. - Moritz Fieback; Guilherme Cardoso Medeiros; Lizhou Wu; Hassen Aziza; Rajendra Bishnoi; Mottaqiallah Taouil; Said Hamdioui (ACM J. Emerg. Technol. Comput. Syst., 2022)

A Survey on Memory-centric Computer Architectures. - Anteneh Gebregiorgis; Hoang Anh Du Nguyen; Jintao Yu; Rajendra Bishnoi; Mottaqiallah Taouil; Francky Catthoor; Said Hamdioui (ACM J. Emerg. Technol. Comput. Syst., 2022)

Characterization, Modeling, and Test of Intermediate State Defects in STT-MRAMs. - Lizhou Wu; Siddharth Rao; Mottaqiallah Taouil; Erik Jan Marinissen; Gouri Sankar Kar; Said Hamdioui (IEEE Trans. Computers, 2022)

MFA-MTJ Model: Magnetic-Field-Aware Compact Model of pMTJ for Robust STT-MRAM Design. - Lizhou Wu; Siddharth Rao; Mottaqiallah Taouil; Erik Jan Marinissen; Gouri Sankar Kar; Said Hamdioui (IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2022)

APmap: An Open-Source Compiler for Automata Processors. - Jintao Yu; Muath Abu Lebdeh; Hoang Anh Du Nguyen; Mottaqiallah Taouil; Said Hamdioui (IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2022)

Instruction flow-based detectors against fault injection attacks. - Troya Çagil Köylü; Cezar Rodolfo Wedig Reinbrecht; Marcelo Brandalero; Said Hamdioui; Mottaqiallah Taouil (Microprocess. Microsystems, 2022)

Device Aware Diagnosis for Unique Defects in STT-MRAMs. - Ahmed Aouichi; Sicong Yuan; Moritz Fieback; Siddharth Rao; Woojin Kim; Erik Jan Marinissen; Sebastien Couet; Mottaqiallah Taouil; Said Hamdioui (ATS, 2023)

Characterization and Test of Intermittent Over RESET in RRAMs. - Hanzhi Xun; Moritz Fieback; Sicong Yuan; Hassen Aziza; Mathijs Heidekamp; Thiago Copetti; Letícia Maria Veiras Bolzani Poehls; Mottaqiallah Taouil; Said Hamdioui (ATS, 2023)

Device-Aware Test for Back-Hopping Defects in STT-MRAMs. - Sicong Yuan; Mottaqiallah Taouil; Moritz Fieback; Hanzhi Xun; Erik Jan Marinissen; Gouri Sankar Kar; Sidharth Rao; Sebastien Couet; Said Hamdioui (DATE, 2023)

A Pre-Silicon Power Leakage Assessment Based on Generative Adversarial Networks. - Abdullah Aljuffri; Mudit Saxena; Cezar Reinbrecht; Said Hamdioui; Mottaqiallah Taouil (DSD, 2023)

Memristor-Based Lightweight Encryption. - Muhammad Ali Siddiqi; Jan Andrés Galvan Hernández; Anteneh Gebreziorgis; Rajendra Bishnoi; Christos Strydis; Said Hamdioui; Mottaqiallah Taouil (DSD, 2023)

Online Fault Detection and Diagnosis in RRAM. - Moritz Fieback; Filip Bradaric; Mottaqiallah Taouil; Said Hamdioui (ETS, 2023)

Dependability of Future Edge-AI Processors: Pandora's Box. - Manil Dev Gomony; Anteneh Gebregiorgis; Moritz Fieback; Marc Geilen; Sander Stuijk; Jan Richter-Brockmann; Rajendra Bishnoi; Sven Argo; Lara Arche Andradas; Tim Güneysu; Mottaqiallah Taouil; Henk Corporaal; et al. (ETS, 2023)

Data Background-Based Test Development for All Interconnect and Contact Defects in RRAMs. - Hanzhi Xun; Moritz Fieback; Sicong Yuan; Ziwei Zhang; Mottaqiallah Taouil; Said Hamdioui (ETS, 2023)

Device-Aware Test for Ion Depletion Defects in RRAMs. - Hanzhi Xun; Sicong Yuan; Moritz Fieback; Hassen Aziza; Mottaqiallah Taouil; Said Hamdioui (ITC, 2023)

Magnetic Coupling Based Test Development for Contact and Interconnect Defects in STT-MRAMs. - Sicong Yuan; Ziwei Zhang; Moritz Fieback; Hanzhi Xun; Erik Jan Marinissen; Gouri Sankar Kar; Sidharth Rao; Sebastien Couet; Mottaqiallah Taouil; Said Hamdioui (ITC, 2023)

Securing an Efficient Lightweight AES Accelerator. - Ruoyu Huang; Abdullah Aljuffri; Said Hamdioui; Kezheng Ma; Mottaqiallah Taouil (TrustCom, 2023)

Modeling and Analysis of SRAM PUF Bias Patterns in 14nm and 7nm FinFET Technology Nodes. - Shayesteh Masoumian; Roel Maes; Rui Wang; Karthik Keni Yerriswamy; Geert Jan Schrijen; Said Hamdioui; Mottaqiallah Taouil (VLSI-SoC, 2023)

A Survey on Machine Learning in Hardware Security. - Troya Çagil Köylü; Cezar Rodolfo Wedig Reinbrecht; Anteneh Gebregiorgis; Said Hamdioui; Mottaqiallah Taouil (ACM J. Emerg. Technol. Comput. Syst., 2023)

Device-Aware Diagnosis for Yield Learning in RRAMs. - Hanzhi Xun; Moritz Fieback; Sicong Yuan; Hassen Aziza; Mottaqiallah Taouil; Said Hamdioui (DATE, 2024)

Trusted SMEs for Sustainable Growth of Europeans Economical Backbone to Strengthen the Digital Sovereignty: The KDT Resilient Trust Project. - Hassan Aboushady; Noemie Beringuier-Boher; Kelly Burke; Philippe Dallemagne; Mario De Biase; Manuel Di Frangia; Virginie Deniau; Enrico Ferrari; Christophe Gaquière; Dominique Morche; Fabio Patrone; Stefano Pesci; et al. (DSD, 2024)

Counteracting Rowhammer by Data Alternation. - Stefan A. Lung; Georgi Gaydadjiev; Said Hamdioui; Mottaqiallah Taouil (ETS, 2024)

Extracting Weights of CIM-Based Neural Networks Through Power Analysis of Adder-Trees. - Fouwad Jamil Mir; Abdullah Aljuffri; Said Hamdioui; Mottaqiallah Taouil (ETS, 2024)

Online Detection of Unique Faults in RRAMs. - Hanzhi Xun; Moritz Fieback; Mohammad Amin Yaldagard; Sicong Yuan; Hassen Aziza; Mottaqiallah Taouil; Said Hamdioui (ETS, 2024)

Design-for-Test for Intermittent Faults in STT-MRAMs. - Sicong Yuan; Mohammad Amin Yaldagard; Hanzhi Xun; Moritz Fieback; Erik Jan Marinissen; Woojin Kim; Siddharth Rao; Sebastien Couet; Mottaqiallah Taouil; Said Hamdioui (ETS, 2024)

Defects, Fault Modeling, and Test Development Framework for FeFETs. - Changhao Wang; Sicong Yuan; Hanzhi Xun; Chaobo Li; Mottaqiallah Taouil; Moritz Fieback; Danyang Chen; Xiuyan Li; Lin Wang 111; Riccardo Cantoro; Chujun Yin; Said Hamdioui (ITC, 2024)

Robust Design-for-Testability Scheme for Conventional and Unique Defects in RRAMs. - Hanzhi Xun; Moritz Fieback; Mohammad Amin Yaldagard; Sicong Yuan; Erbing Hua; Hassen Aziza; Mottaqiallah Taouil; Said Hamdioui (ITC, 2024)

Testing STT-MRAMs: Do We Need Magnets in our Automated Test Equipment? - Sicong Yuan; Hanzhi Xun; Woojin Kim; Siddharth Rao; Erik Jan Marinissen; Sebastien Couet; Moritz Fieback; Mottaqiallah Taouil; Said Hamdioui (ITC, 2024)

Analysis of Conductance Variability in RRAM for Accurate Neuromorphic Computing. - Hassen Aziza; Jérémy Postel-Pellerin; Moritz Fieback; Said Hamdioui; Hanzhi Xun; Mottaqiallah Taouil; Karine Coulié; Wenceslas Rahajandraibe (LATS, 2024)

Analyzing the Use of Temperature to Facilitate Fault Propagation in ReRAMs. - Thiago Copetti; A. Chordia; Moritz Fieback; Mottaqiallah Taouil; Said Hamdioui; Letícia Maria Veiras Bolzani (LATS, 2024)

A Unified Functional Safety EDA Framework for Accurate Diagnostic Coverage Estimation. - Abhiroop Bhowmik; Subin Babukutty; Mottaqiallah Taouil; Moritz Fieback (VLSI-SoC, 2024)

Multi-Level FeFET-Based CAM Address Decoder. - Thomas Makryniotis; Georgi Gaydadjiev; Said Hamdioui; Mottaqiallah Taouil (VLSI-SoC, 2024)

Memristor-Based Lightweight Encryption. - Muhammad Ali Siddiqi; Jan Andrés Galvan Hernández; Anteneh Gebregiorgis; Rajendra Bishnoi; Christos Strydis; Said Hamdioui; Mottaqiallah Taouil (CoRR, 2024)

Survey on Architectural Attacks: A Unified Classification and Attack Model. - Tara Ghasempouri; Jaan Raik; Cezar Reinbrecht; Said Hamdioui; Mottaqiallah Taouil (ACM Comput. Surv., 2024)

The Security Evaluation of an Efficient Lightweight AES Accelerator. - Abdullah Aljuffri; Ruoyu Huang; Laura Muntenaar; Georgi Gaydadjiev; Kezheng Ma; Said Hamdioui; Mottaqiallah Taouil (Cryptogr., 2024)

Device-Aware Test for Anomalous Charge Trapping in FeFETs. - Sicong Yuan; Changhao Wang; Moritz Fieback; Hanzhi Xun; Mottaqiallah Taouil; Xiuyan Li; Danyang Chen; Lin Wang 111; Nicolò Bellarmino; Riccardo Cantoro; Said Hamdioui (ASP-DAC, 2025)

Multi-Partner Project: Securing Future Edge-AI Processors in Practice (CONVOLVE). - Sven Argo; Henk Corporaal; Alejandro Garza; Marc Geilen; Manil Dev Gomony; Tim Güneysu; Adrian Marotzke; Fouwad Jamil Mir; Jan Richter-Brockmann; Jeffrey Smith 001; Mottaqiallah Taouil; Said Hamdioui (DATE, 2025)

European Test Symposium Teams: an Anniversary Snapshot. - Maksim Jenihhin; Jaan Raik; Artur Jutman; Natalia Cherezova; Raimund Ubar; Liviu Miclea; Szilárd Enyedi; I. Stefan; Ovidiu Stan; Cosmina Corches; Z. Peng; Petru Eles; et al. (ETS, 2025)

Modeling and Analysis of Aging Impact on SRAM PUFs for Advanced FinFET Technology Nodes. - Shayesteh Masoumian; Roel Maes; Noemie Beringuier-Boher; Karthik Keni Yerriswamy; Geert Jan Schrijen; Said Hamdioui; Mottaqiallah Taouil (ETS, 2025)

Dependable Neuromorphic Computing-in-Memory Architectures. - Farhad Merchant; Ankit Bende; Markus Fritscher; Shahar Kvatinsky; Simranjeet Singh; Vikas Rana; Regina Dittmann; Keerthi Dorai Swamy Reddy; Christian Wenger; Fouwad Jamil Mir; Mottaqiallah Taouil; Manil Dev Gomony; et al. (ETS, 2025)

Structural Testing of a RRAM-based AI Accelerator Core. - Emmanouil Anastasios Serlis; Hanzhi Xun; Mottaqiallah Taouil; Said Hamdioui; Moritz Fieback (ETS, 2025)

In-Field Monitoring and Preventing Read Disturb Faults in RRAMs. - Hanzhi Xun; Moritz Fieback; Sicong Yuan; Changhao Wang; Erbing Hua; Hassen Aziza; Leticia Bolzani Poehls; Riccardo Cantoro; Rajendra Bishnoi; Mottaqiallah Taouil; Said Hamdioui (ETS, 2025)

Flexible Hardware Accelerators for Ultra-Low Power Edge AI: The CONVOLVE Approach. - Panagiotis Chaidos; Alexios Maras; Georgios Alexandris; Xiaoling; Asmae El Arrassi; Bas Ahn; James D. Garside; Yunhao Deng; Theofilos Spyrou; Anteneh Gebregiorgis; Mottaqiallah Taouil; Manil Dev Gomony; et al. (ISVLSI, 2025)

Multi-Partner Project: Securing Future Edge-AI Processors in Practice (CONVOLVE). - Sven Argo; Henk Corporaal; Alejandro Garza; Marc Geilen; Manil Dev Gomony; Tim Güneysu; Adrian Marotzke; Fouwad Jamil Mir; Christian Larmann; Jan Richter-Brockmann; Jeffrey Smith 001; Mottaqiallah Taouil; et al. (IACR Cryptol. ePrint Arch., 2025)