Measuring process capability based on CPK with gauge measurement errors. - Wen Lea Pearn; Mou-Yuan Liao (Microelectron. Reliab., 2005)

One-sided Process Capability Assessment in the Presence of Measurement Errors. - Wen Lea Pearn; Mou-Yuan Liao (Qual. Reliab. Eng. Int., 2006)

Estimating and testing process yield with imprecise data. - Chien-Wei Wu; Mou-Yuan Liao (Expert Syst. Appl., 2009)

Evaluating process performance based on the incapability index for measurements with uncertainty. - Mou-Yuan Liao; Chien-Wei Wu (Expert Syst. Appl., 2010)

Fuzzy inference to supplier evaluation and selection based on quality index: a flexible approach. - Mou-Yuan Liao; Chien-Wei Wu; Jia-Wei Wu (Neural Comput. Appl., 2013)

Fuzzy nonlinear programming approach for evaluating and ranking process yields with imprecise data. - Chien-Wei Wu; Mou-Yuan Liao (Fuzzy Sets Syst., 2014)

On ranking multiple touch-screen panel suppliers through the CTQ: applied fuzzy techniques for inspection with unavoidable measurement errors. - Chien-Wei Wu; Mou-Yuan Liao; Chung-Yang Lin (Neural Comput. Appl., 2014)

Reliable confidence intervals for assessing normal process incapability. - Mou-Yuan Liao; Chien-Hua Lin; Chien-Wei Wu; Chienhui Yang (Commun. Stat. Simul. Comput., 2017)

Efficient Technique for Assessing Actual Non-normal Quality Loss: Markov Chain Monte Carlo. - Mou-Yuan Liao (Qual. Reliab. Eng. Int., 2017)

Supplier selection based on normal process yield: the Bayesian inference. - Mou-Yuan Liao; Chien-Wei Wu (Neural Comput. Appl., 2020)