Mini-Block-Based Cipher Class for Physically Clone-Resistant Devices. - Saleh Mulhem; Mouadh Ayache; Wael Adi (EST, 2019)

On the Dependability Lifecycle of Electrical/Electronic Product Development: The Dual-Cone V-Model. - Bernhard Bauer 003; Mouadh Ayache; Saleh Mulhem; Meirav Nitzan; Jyotika Athavale; Rainer Buchty; Mladen Berekovic (Computer, 2022)

Continual BatchNorm Adaptation (CBNA) for Semantic Segmentation. - Marvin Klingner; Mouadh Ayache; Tim Fingscheidt (IEEE Trans. Intell. Transp. Syst., 2022)

Holistic Framework for Evaluating the Trustworthiness of Integrated Circuits. - Mouadh Ayache; Enkele Rama; Saleh Mulhem; Mladen Berekovic; Matthias Korb (VLSI-SoC, 2024)

Trustworthy Integrated Circuits: From Safety to Security and Beyond. - Enkele Rama; Mouadh Ayache; Rainer Buchty; Bernhard Bauer 003; Matthias Korb; Mladen Berekovic; Saleh Mulhem (IEEE Access, 2024)