Comparative study of sensitive volume and triggering criteria of SEB in 600 V planar and trench IGBTs. - Moustafa Zerarka; Patrick Austin; Marise Bafleur (Microelectron. Reliab., 2011)

Optimization of a MOS-IGBT-SCR ESD protection component in smart power SOI technology. - Houssam Arbess; Marise Bafleur; David Trémouilles; Moustafa Zerarka (Microelectron. Reliab., 2015)

A methodologic project to characterize and model COTS component reliability. - André Durier; Alain Bensoussan 002; Moustafa Zerarka; Chaimae Ghfiri; Alexandre Boyer; Hélène Frémont (Microelectron. Reliab., 2015)

Radiation robustness of normally-off GaN/HEMT power transistors (COTS). - Moustafa Zerarka; Olivier Crépel (Microelectron. Reliab., 2018)