Compact Layout Rule Extraction for Latchup Prevention in a 0.25-?m Shallow-Trench-Isolation Silicided Bulk CMOS Process. - Ming-Dou Ker; Wen-Yu Lo; Tung-Yang Chen; Howard Tang; S.-S. Chen; Mu-Chun Wang (ISQED, 2001)

iCane - A Partner for the Visually Impaired. - Tsung-Hsiang Chang; Chien-Ju Ho; David Chawei Hsu; Yuan-Hsiang Lee; Min-Shieh Tsai; Mu-Chun Wang; Jane Yung-jen Hsu (EUC Workshops, 2005)

Trend transformation of drain-current degradation under drain-avalanche hot-carrier stress for CLC n-TFTs. - Zhen-Ying Hsieh; Mu-Chun Wang; Chih Chen; Jia-Min Shieh; Yu-Ting Lin; Shuang-Yuan Chen; Heng-Sheng Huang (Microelectron. Reliab., 2009)

Promoting of charged-device model/electrostatic discharge immunity in the dicing saw process. - Mu-Chun Wang; Chuan-Hsi Liu; Kuo-Shu Huang; Zhen-Ying Hsieh; Shuang-Yuan Chen; Hsin-Chia Yang; Chii-Ruey Lin (Microelectron. Reliab., 2010)

Leakage current mechanism and effect of Y2O3 doped with Zr high-K gate dielectrics. - K. C. Lin; P. C. Juan; C. H. Liu; Mu-Chun Wang; C. H. Chou (Microelectron. Reliab., 2015)

Heat stress exposing performance of deep-nano HK/MG nMOSFETs using DPN or PDA treatment. - Shea-Jue Wang; Mu-Chun Wang; Shuang-Yuan Chen; Wen-How Lan; Bor-Wen Yang; L. S. Huang; Chuan-Hsi Liu (Microelectron. Reliab., 2015)

Thermal stress probing the channel-length modulation effect of nano n-type FinFETs. - Fu-Yuan Tuan; Chii-Wen Chen; Mu-Chun Wang; Wen-Shiang Liao; Shea-Jue Wang; Shou-Kong Fan; Wen-How Lan (Microelectron. Reliab., 2018)

Electrical and Physical Characteristics of WO3/Ag/WO3 Sandwich Structure Fabricated with Magnetic-Control Sputtering Metrology †. - Shea-Jue Wang; Mu-Chun Wang; Shih-Fan Chen; Yu-Hsiang Li; Tien-Szu Shen; Hui-Yun Bor; Chao-Nan Wei (Sensors, 2018)

Q-factor Integrity of 28nm-node High-k Gate Dielectric. - Ying-Jun Deng; Hao-Lun Hu; Yu-Han Liang; Jian-Ming Chen; Ching-Chuan Chou; Shea-Jue Wang; Mu-Chun Wang (ICKII, 2020)

Patterns of Exposing Integrity of 28nm-node High-k Gate Dielectric on p-substrate with Nitridation Treatments. - Si-Ping Li; Jia-Wei Xu; Wei-Hao Li; Jian-Ming Chen; Chao-Nan Wei; Wen-How Lan; Mu-Chun Wang (ICKII, 2020)

Junction Integrity for 28nm High-k nMOSFETs with Thermal Stress. - Yu-Chen Lin; Kai-Chun Zhan; Ji-Min Zhang; Jian-Ming Chen; Cheng-Hsun-Tony Chang; Shea-Jue Wang; Mu-Chun Wang (ICKII, 2020)

Fringe Gate Leakage of 28nm HK/MG nMOSFETs with Nitridation Treatments. - De-Cheng Zhang; Ching-Chuan Chou; Ho-Hsiang Chen; Shang-Ze Chen; Jian-Ming Chen; Hui-Yun Bor; Wen-How Lan; Mu-Chun Wang (ICKII, 2020)

RCD: Relation Map Driven Cognitive Diagnosis for Intelligent Education Systems. - Weibo Gao; Qi Liu 003; Zhenya Huang; Yu Yin 002; Haoyang Bi; Mu-Chun Wang; Jianhui Ma; Shijin Wang 001; Yu Su 002 (SIGIR, 2021)

Textomics: A Dataset for Genomics Data Summary Generation. - Mu-Chun Wang; Zixuan Liu 001; Sheng Wang 012 (ACL (1), 2022)

Analyzing and Simulating User Utterance Reformulation in Conversational Recommender Systems. - Shuo Zhang 006; Mu-Chun Wang; Krisztian Balog (SIGIR, 2022)