Systematic Hold-time Fault Diagnosis and Failure Debug in Production Chips. - Chih-Yan Liu; Mu-Ting Wu; James Chien-Mo Li; Gaurav Bhargava; Chris Nigh (ATS, 2020)

Diagnosis technique for Clustered Multiple Transition Delay Faults. - Yan-Shen You; Chih-Yan Liu; Mu-Ting Wu; Po-Wei Chen; James Chien-Mo Li (ITC-Asia, 2020)

Machine Learning-Based Test Pattern Generation for Neuromorphic Chips. - Hsiao-Yin Tseng; I-Wei Chiu; Mu-Ting Wu; James Chien-Mo Li (ICCAD, 2021)

Improving Volume Diagnosis and Debug with Test Failure Clustering and Reorganization. - Mu-Ting Wu; Cheng-Sian Kuo; James Chien-Mo Li; Chris Nigh; Gaurav Bhargava (ITC, 2021)

Vector-based Dynamic IR-drop Prediction Using Machine Learning. - Jia-Xian Chen; Shi-Tang Liu; Yu-Tsung Wu; Mu-Ting Wu; Chien-Mo James Li; Norman Chang; Ying-Shiun Li; Wentze Chuang (ASP-DAC, 2022)