Towards adaptive test of multi-core RF SoCs. - Rajesh Mittal; Lakshmanan Balasubramanian; Y. B. Chethan Kumar; V. R. Devanathan; Mudasir Kawoosa; Rubin A. Parekhji (DATE, 2013)

Systematic approach for trim test time optimization: Case study on a multi-core RF SOC. - Rajesh Mittal; Mudasir Kawoosa; Rubin A. Parekhji (ITC, 2014)

Towards Single Pin Scan for Extremely Low Pin Count Test. - Mudasir S. Kawoosa; Rajesh K. Mittal; Maheedhar Jalasuthram; Rubin A. Parekhji (VLSID, 2018)