SONAR Based Obstacle Detection and Avoidance Algorithm. - Muhammad Adil Ansari; Fahim Aziz Umrani (ICSAP, 2009)

Scan-Puf: Puf Elements Selection Methods for Viable IC Identification. - Dooyoung Kim; Muhammad Adil Ansari; Jihun Jung; Sungju Park (ATS, 2015)

Efficient diagnosis technique for aging defects on automotive semiconductor chips. - Jihun Jung; Muhammad Adil Ansari; Dooyoung Kim; Hyunbean Yi; Sungju Park (ETS, 2015)

Time-multiplexed test access architecture for stacked integrated circuits. - Muhammad Adil Ansari; Jihun Jung; Dooyoung Kim; Sungju Park (IEICE Electron. Express, 2016)

On Diagnosing the Aging Level of Automotive Semiconductor Devices. - Jihun Jung; Muhammad Adil Ansari; Dooyoung Kim; Hyunbean Yi; Sungju Park (IEEE Trans. Circuits Syst. II Express Briefs, 2017)

Time-Multiplexed 1687-Network for Test Cost Reduction. - Muhammad Adil Ansari; Jihun Jung; Dooyoung Kim; Sungju Park (IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2018)

Erratum to "Time-Multiplexed-Network for Test Cost Reduction". - Muhammad Adil Ansari; Jihun Jung; Dooyoung Kim; Sungju Park (IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2018)

Test Architecture for Systolic Array of Edge-Based AI Accelerator. - Umair Saeed Solangi; Muhammad Ibtesam; Muhammad Adil Ansari; Jinuk Kim; Sungju Park (IEEE Access, 2021)

Highly Efficient Test Architecture for Low-Power AI Accelerators. - Muhammad Ibtesam; Umair Saeed Solangi; Jinuk Kim; Muhammad Adil Ansari; Sungju Park (IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2022)

Reliable Test Architecture With Test Cost Reduction for Systolic-Based DNN Accelerators. - Muhammad Ibtesam; Umair Saeed Solangi; Jinuk Kim; Muhammad Adil Ansari; Sungju Park (IEEE Trans. Circuits Syst. II Express Briefs, 2022)