Statistical aspects of reliability in bulk MOSFETs with multiple defect states and random discrete dopants. - Muhammad Faiz Bukhori; Scott Roy; Asen Asenov (Microelectron. Reliab., 2008)

Accurate capturing of the statistical aspect of NBTI/PBTI variability into statistical compact models. - Muhammad Faiz Bukhori; Noor Ain Kamsani; Asen Asenov; Nazrul Anuar Nayan (Microelectron. J., 2012)

Low power 18T pass transistor logic ripple carry adder. - Veeraiyah Thangasamy; Noor Ain Kamsani; Mohd Nizar Hamidon; Shaiful Jahari Hashim; Zubaida Binti Yusoff; Muhammad Faiz Bukhori (IEICE Electron. Express, 2015)