Single Event Upset rate determination for 65 nm SRAM bit-cell in LEO radiation environments. - Muhammad Sajid 003; Nikolay G. Chechenin; Frank Sill Torres; Usman Ali Gulzari; Muhammad Usman Butt; Zhu Ming; E. U. Khan (Microelectron. Reliab., 2017)

Comparative analysis of 2D mesh topologies with additional communication links for on-chip networks. - Usman Ali Gulzari; Zoran Salcic; Waqar Farooq; Sheraz Anjum; Sarzamin Khan; Muhammad Sajid 003; Frank Sill Torres (Comput. Networks, 2024)