The Impact of Silicon Concentration on the Reliability of Tungsten Silicide. - Liangshan Chen; Yinghong Zhao; Ki-Don Lee; Manisha Sharma; Joonah Yoon; Timothy Davis; Kayla N. Sanders; Myungsoo Yeo; Amado Longoria; Shou-Liang Zhang; Ju Kwang Kim; Dung Dau; et al. (IRPS, 2025)

Impact of Bi-Layer Gate Stack and Thickness on Low Frequency TDDB in FinFET and Planar Devices. - Kartika Chandra Sahoo; Rakesh Ranjan; Ki-Don Lee; Junehwan Jonathan Kim; Robert Moeller; Pavitra Ramadevi Perepa; John A. Frerich; Ju Kwang Kim; Dung Dau; Mukyeng Jung (IRPS, 2025)