Single Event Resilient Dynamic Logic Designs. - Haibin Wang; Mulong Li; Li Chen 001; Rui Liu 011; Sanghyeon Baeg; Shi-Jie Wen; Richard Wong; Rita Fung; Jinshun Bi (J. Electron. Test., 2014)

A Novel Built-in Current Sensor for N-WELL SET Detection. - Haibin Wang; Rui Liu 011; Li Chen 001; Jinshun Bi; Mulong Li; Yuanqing Li (J. Electron. Test., 2015)

Layout-based Single Event Mitigation Techniques for Dynamic Logic Circuits. - Haibin Wang; Mulong Li; Xixi Dai; Shuting Shi; Li Chen 001; Gang Guo (J. Electron. Test., 2016)