Reverse conducting-IGBTs initial snapback phenomenon and its analytical modelling. - Umamaheswara Vemulapati; Nando Kaminski; Dieter Silber; Liutauras Storasta; Munaf Rahimo (IET Circuits Devices Syst., 2014)

The impact on power semiconductor device operation due to local electric field alterations in the planar junction termination. - Munaf Rahimo; Frank Richter; Fabian Fischer 002; Umamaheswara Vemulapati; Arnost Kopta; Chiara Corvasce; Silvan Geissmann; Marco Bellini; Martin J. Bayer; Friedhelm Bauer (Microelectron. Reliab., 2016)

Comparison of thermal runaway limits under different test conditions based on a 4.5 kV IGBT. - Paula Diaz Reigosa; Daniel Prindle; Gontran Pâques; Silvan Geissmann; Francesco Iannuzzo; Arnost Kopta; Munaf Rahimo (Microelectron. Reliab., 2016)

Extraction of dynamic avalanche during IGBT turn off. - Silvan Geissmann; L. De Michielis; Chiara Corvasce; Munaf Rahimo; M. Andenna (Microelectron. Reliab., 2017)

Capacitive effects in IGBTs limiting their reliability under short circuit. - Paula Diaz Reigosa; Francesco Iannuzzo; Munaf Rahimo; Frede Blaabjerg (Microelectron. Reliab., 2017)

The influence of humidity on the high voltage blocking reliability of power IGBT modules and means of protection. - Charalampos Papadopoulos; Chiara Corvasce; Arnost Kopta; Daniel Schneider; Gontran Pâques; Munaf Rahimo (Microelectron. Reliab., 2018)

IGCT Low-Current Switching - TCAD and Experimental Characterization. - Dragan Stamenkovic; Umamaheswara Vemulapati; Thomas Stiasny; Munaf Rahimo; Drazen Dujic (IEEE Trans. Ind. Electron., 2020)

Enhancing Efficiency and Reliability of Electric Vehicles via Adaptive E-Gear Control. - Luca Sandel; Gioele Zardini; Sofija Mitrova; Tanya Thekemuriyil; Renato Minamisawa; Munaf Rahimo; Andrea Censi; Emilio Frazzoli; Silvia Mastellone (ITSC, 2023)