Characteristics Variability Evaluation of Actual LSI Transistors with Nanoprobing. - Munetoshi Fukui; Yasuhiko Nara; Junichi Fuse (Asian Test Symposium, 2012)

Verification of the Injection Enhancement Effect in IGBTs by Measuring the Electron and Hole Currents Separately. - Takuya Hoshii; Kazuyoshi Furukawa; Kuniyuki Kakushima; Masahiro Watanabe; Naoyuki Shigvo; Takuya Saraya; Toshihiko Takakura; Kazuo Itou; Munetoshi Fukui; Shinichi Suzuki; Kiyoshi Takeuchi; Iriya Muneta; et al. (ESSDERC, 2018)

Switching of 3300V Scaled IGBT by 5V Gate Drive. - Toshiro Hiramoto; Katsumi Satoh; Tomoko Matsudai; Wataru Saito; Kuniyuki Kakushima; Takuya Hoshii; Kazuyoshi Furukawa; Masahiro Watanabe; Naoyuki Shigyo; Hitoshi Wakabayashi; Kazuo Tsutsui; Hiroshi Iwai; et al. (ASICON, 2019)