Boundary-Focused Semantic Segmentation for Limited Wafer Transmission Electron Microscope Images. - Yongwon Jo; Jinsoo Bae; Hansam Cho; Heejoong Roh; Kyunghye Kim; Munki Jo; Jaeung Tae; Seoung Bum Kim (IEA/AIE, 2024)

Super-Resolution Methods for Wafer Transmission Electron Microscopy Images. - Sungsu Kim; Insung Baek; Hansam Cho; Heejoong Roh; Kyunghye Kim; Munki Jo; Jaeung Tae; Seoung Bum Kim (IEA/AIE, 2024)

Robust Semantic Segmentation of Wafer Transmission Electron Microscopy Image Using Multi-Task Learning With Edge Detection. - Yongwon Jo; Jinsoo Bae; Hansam Cho; Sungsu Kim; Heejoong Roh; Kyung Hye Kim; Munki Jo; Munuk Kim; Jaeung Tae; Seoung Bum Kim (IEEE Access, 2025)