Improving Memory Reliability by Bounding DRAM Faults: DDR5 improved reliability features. - Kjersten Criss; Kuljit Bains; Rajat Agarwal; Tanj Bennett; Terry Grunzke; Jangryul Keith Kim; Hoeju Chung; Munseon Jang (MEMSYS, 2020)

HBM3 RAS: Enhancing Resilience at Scale. - Sudhanva Gurumurthi; Kijun Lee; Munseon Jang; Vilas Sridharan; Aaron Nygren; Yesin Ryu; Kyomin Sohn; Taekyun Kim; Hoeju Chung (IEEE Comput. Archit. Lett., 2021)