Impact of RF stress on the low-frequency noise in nMOSFETs. - Haipeng Fu; Muqian Niu; Liping Yang; Xuguang Li; Kaixue Ma (IEICE Electron. Express, 2021)

Analysis and modeling for MOSFET degradation under RF stress. - Haipeng Fu; Liping Yang; Muqian Niu; Xuguang Li; Kaixue Ma (IEICE Electron. Express, 2021)