Feature Extraction and Selection in Tool Condition Monitoring System. - Jie Sun 011; Geok Soon Hong; Mustafizur Rahman 002; Yoke San Wong (Australian Joint Conference on Artificial Intelligence, 2002)

The Application of Nonstandard Support Vector Machine in Tool Condition Monitoring System. - Jie Sun 011; Geok Soon Hong; Mustafizur Rahman 002; Yoke San Wong (DELTA, 2004)

Multi-niche crowding in the development of parallel genetic simulated annealing. - Zhigang Wang; Mustafizur Rahman 002; Yoke San Wong (GECCO, 2005)

Molecular dynamics simulation of the effect of tool edge radius on cutting forces and cutting region in nanoscale ductile cutting of silicon. - M. B. Cai; X. P. Li; Mustafizur Rahman 002 (Int. J. Manuf. Technol. Manag., 2005)

Development of a parallel optimization method based on genetic simulated annealing algorithm. - Zhigang Wang; Yoke San Wong; Mustafizur Rahman 002 (Parallel Comput., 2005)

Molecular dynamics modelling and simulation of nanoscale ductile cutting of silicon. - Minbo Cai; Xiaoping Li; Mustafizur Rahman 002 (Int. J. Comput. Appl. Technol., 2007)

Identification of feature set for effective tool condition monitoring - a case study in titanium machining. - Jie Sun 011; Yoke San Wong; Geok Soon Hong; Mustafizur Rahman 002; Zhigang Wang (CASE, 2008)

Study of WEDM parameter phenomena for microfabrication. - Sadiq M. Alam; Mustafizur Rahman 002; H. S. Lim (Int. J. Manuf. Technol. Manag., 2008)

Editorial: Micro/Nano Machining - Processes, Systems and Control. - Mustafizur Rahman 002 (Int. J. Autom. Technol., 2011)

A System Development Approach for Electrolytic In-Process Dressing (ELID) Grinding. - Tanveer Saleh; Mustafizur Rahman 002 (Int. J. Autom. Technol., 2011)

In-Process Truing for ELID (Electrolytic In-Process Dressing) Grinding by Pulsewidth Control. - Tanveer Saleh; Mustafizur Rahman 002 (IEEE Trans Autom. Sci. Eng., 2011)

Feature analysis in tool condition monitoring: a case study in titanium machining. - Jie Sun 011; Yoke San Wong; Geok Soon Hong; Mustafizur Rahman 002 (Int. J. Comput. Appl. Technol., 2012)