Characterization and analysis of trap-related effects in AlGaN-GaN HEMTs. - Mustapha Faqir; Giovanni Verzellesi; Fausto Fantini; Francesca Danesin; Fabiana Rampazzo; Gaudenzio Meneghesso; Enrico Zanoni; Anna Cavallini; Antonio Castaldini; Nathalie Labat; André Touboul; Christian Dua (Microelectron. Reliab., 2007)

Analysis of current collapse effect in AlGaN/GaN HEMT: Experiments and numerical simulations. - Mustapha Faqir; Mohsine Bouya; Nathalie Malbert; Nathalie Labat; D. Carisetti; Benoit Lambert; Giovanni Verzellesi; Fausto Fantini (Microelectron. Reliab., 2010)

AlGaN/GaN HEMT device reliability and degradation evolution: Importance of diffusion processes. - Martin Kuball; Milan Tapajna; Richard J. T. Simms; Mustapha Faqir; Umesh K. Mishra (Microelectron. Reliab., 2011)

Improved thermal management for GaN power electronics: Silver diamond composite packages. - Mustapha Faqir; Tim Batten; T. Mrotzek; S. Knippscheer; M. Massiot; M. Buchta; Hervé Blanck; Stéphane Rochette; Olivier Vendier; Martin Kuball (Microelectron. Reliab., 2012)

Through glass via thermomechanical analysis: Geometrical parameters effect on thermal stress. - Abdellah Benali; Mohsine Bouya; Mustapha Faqir; Abderrahim El Amrani; Mounir Ghogho; A. Benabdellah (IDT, 2013)

A study of through package vias in a glass interposer for multifunctional and miniaturized systems. - Abderrahim El Amrani; Abdellah Benali; Mohsine Bouya; Mustapha Faqir; K. Demir; Abdelkader Hadjoudja; Mounir Ghogho (Microelectron. Reliab., 2014)

Deep Learning for Inferring the Surface Solar Irradiance from Sky Imagery. - Mehdi Zakroum; Mounir Ghogho; Mustapha Faqir; Mohamed Aymane Ahajjam (CoRR, 2018)